|ESD Tester ||Package Tester ||HED-N5000-DCPC ||HED-N5000 |
Full Automated ESD (HBM, MM) tester up to 1,056 pin count.
Up to 8 sockets on board.
Meets international standards (JEDEC, ESDA)
Latchup option is available.
Compatible with Hanwa S5000 and Verifire socket boards
|HED-S5000-DCPC HED-S5000 ||HED-S5000 |
The basic and most popular package-level ESD (HBM, MM) tester.
128 and 256 pin-count systems are available.
Both stand-alone model and fully automated pass/fail judgment with integrated software available.
Meets international standards (JEITA/ESDA/JEDEC).
Latch-up options (pulse current, over voltage, ESD pulse) are available.
SCM (10pF surge) option available.
|HCE-5000 ||HCE-5000 |
Ultra-compact portable ESD (HBM, MM) tester.
Suitable for on-site testing.
Equipped with curve tracer for pass/fail judgment
Recommended for both IC manufacturers and end-users.
|Wafer Level Tester ||HED-W5000M ||HED-W5000M |
Affordable and versatile manual wafer-level tester.
Dedicated software available for leak measurement and judgment.
Works with most types of manual probe stations.
|HED-W5100D ||HED-W5100D |
Auto probe station and wafer mapping program enabled fully automated Wafer-level ESD testing.
CCD camera equipped
Supports up to 12-inch (300mm) wafer.
Can be integrated with Hanwa TLP Tester, HED-T5000 and T5000VF
Woks as high-pin count package-level tester without socket board.
SCM (10pF surge) option is available.
|HED-W5000M-WFC ||HED-W5000M-WFC |
Hanwa now offers HBM and HMM waveform capture systems.
Waveform is captured at the DUT level.
You no longer need an ESD gun for IEC61000-4-2/HMM testing.
|CDM Tester ||HED-C5000R ||HED-C5000R |
Table-top size, compact, accurate and reliable CDM tester.
CCD cameras equipped
Meets international standards (JEDEC, ESDA, AEC, JEDEC, EIAJ)
Offers both FI-CDM and D-CDM modes.
Can measure capacitance of each pin.
|TLP Tester || ||HED-T5000, HED-T5000VF |
Offers both normal and VF (very fast) models.
VF model offers both normal(100nm/200nm) and VF(1nm-) pulse widths.
Optional automated testing with semi-auto probe station consolidation dramatically improves productivity.
Can be combined with HED-W5000, ESD (HBM, MM) tester
|Open-Short Tester ||HED-V3000S ||HED-V3000S |
Multi-function curve tracer with pass/fail judgment, 512/768/1,024 pin systems
|HED-V3000N ||HED-V3000N |
128-1,024 pin curve tracer with pass/fail judgment
|Immunity Tester || ||HIT-5000 |
|ESD Testing Service ||Hanwa offers ESD, Latchup, CDM testing services using the state-of-art Hanwa Testers. |
Please contact us for more details.