Sản phẩm

Kết quả tìm kiếm : có 11 sản phẩm

1081_CAMECA

Cameca-3D ATOM PROBE (Model:LEAP Si)

High Performance 3D Atom Probe for Semiconductors, Electronic Devices, and Nanomagnetics ...
1080_CAMECA

Cameca-3D ATOM PROBE (Model:LEAP HR)

High Performance 3D Atom Probe for Advanced Materials and Metals Applications The LEAP 4000X HRTM ...
1079_CAMECA

Cameca-EPMA (Model:Shielded SX)

Shielded Electron Probe MicroAnalyzer for Radioactive Samples The Shielded SX has been ...
1078_SXFiveFE

Cameca-EPMA (Model:SXFiveFE)

SXFiveFE Field Emission ...
1077_CAMECA

Cameca-EPMA (Model:SXFive)

Electron Probe Micro Analyzer for Materials & Geosciences Combining advanced electron optics, ...
1076_CAMECA

Cameca-SIMS (Model:4550)

Quadrupole SIMS Microprobe for dopant depth profiling and thin layer analysis in semiconductors. ...
1075_CAMECA

Cameca-NanoSIMS (Model:50L)

SIMS Microprobe for Isotopic and Trace Element Analysis at High Spatial Resolution The CAMECA ...
1074_CAMECA

Cameca-IMS (Model:1280-HR)

Ultra High Sensitivity Magnetic Sector SIMS for Geosciences The CAMECA IMS 1280-HR is a large ...
1073_CAMECA

Cameca-IMS (Model:Wf)

Full Wafer Magnetic Sector SIMS for Advanced Semiconductor Metrology The CAMECA IMS Wf ...
1072_IMS

Cameca-IMS (Model:7f-Auto)

New dynamic SIMS tool for high throughput, fully automated microanalysis. The IMS 7f-Auto is the ...



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