A High Throughput Tester for Flexible Testing of Devices such as MCPs
As cell phones and notebook PCs become more compact and yet incorporate ever more enhanced functionality, memory devices have correspondingly increased in speed and in storage capacity.
Furthermore, the demand for stacked devices, such as DRAM + flash devices and multi-chip packages (MCPs), has skyrocketed due to the diversification of the end-market usage.
The T5587 is able to meet this demand with its enhanced flash memory testing function and high throughput, capable of a maximum testing rate of 400 Mbps and simultaneously testing up to 512 devices
Simultaneous Testing of Up to 512 Devices
The T5587 meets the higher throughput requirements of MCPs, and achieves simultaneous testing of up to 512 devices.
Test Flash Memory Devices at High Speeds
The T5587 is capable of high-speed testing at 400 Mbps. Furthermore, an enhanced bad block mask function and a newly designed high-speed data transfer BUS enable this system to drastically reduce the testing times for simultaneous testing of NAND-type flash memory devices.
The Multi-language Operating System FutureSuite®
Use of the multi-language operating system FutureSuite® allows programming in the worldwide standard, C and ATL languages.
|Target Devices||DDR-SDRAMs, FLASH memories|
|Simultaneous Testing||Up to 512 devices per system|